The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. © 2015 IEEE.
An extension to IEEE Std. 1241 Sine Fit for Analog-to-Information Converters Testing
Daponte P;De Vito L;Rapuano S
2015-01-01
Abstract
The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. © 2015 IEEE.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
