The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. © 2015 IEEE.
An extension to IEEE Std. 1241 Sine Fit for Analog-to-Information Converters Testing
Daponte P;De Vito L;Rapuano S
2015-01-01
Abstract
The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. © 2015 IEEE.File in questo prodotto:
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