We have investigated the quasiparticle noise phenomena of Nb/Al/AlOx/Nb Josephson tunnel junctions fabricated with a window geometry. In the subgap region the I}< characteristics display excess currents at voltages corresponding to submultiples of the gap value. These structures can be ascribed to higher-order processes through the tunnel barrier. In the same voltage region, measurements performed by using a low-frequency technique are strongly indicative of shot noise levels higher than the expected ideal values.

Noise investigations in the subgap region of Nb-based tunnel junctions

Romano P;
2000-01-01

Abstract

We have investigated the quasiparticle noise phenomena of Nb/Al/AlOx/Nb Josephson tunnel junctions fabricated with a window geometry. In the subgap region the I}< characteristics display excess currents at voltages corresponding to submultiples of the gap value. These structures can be ascribed to higher-order processes through the tunnel barrier. In the same voltage region, measurements performed by using a low-frequency technique are strongly indicative of shot noise levels higher than the expected ideal values.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12070/893
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