Global trade relies on the ability to reproducibly and accurately communicate the performance of products and to support these attestations. This standardization is essential for accurate, reproducible, reliable, and communicable characterization of the performance of these devices, to support technology and product advancement, product comparison and performance tracking, and device calibration and traceability. Standard terms and definitions, reproducible test methods, and accurate computational procedures are necessary for this communication and facilitate economic growth and technology evolution through the common understanding of technology. The IEEE Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement Society (IMS), fulfills the global need for standardized terms and test and computational methods for describing and/or measuring the parameters that describe the performance of signal generators and waveform recorders and analyzers. The TC-10 has developed and maintains the following documentary standards: IEEE Std 181-2011, 'Standard on Transitions, Pulses, and Related Waveforms' [1]; IEEE Std 1057-2017, 'Standard for Digitizing Waveform Recorders' [2]; IEEE Std 1241-2010, 'Standard for Terminology and Test Methods for Analog-to-Digital Converters' [3]; IEEE Std 1658-2011, 'Standard for Terminology and Test Methods for Digital-to-Analog Converters' [4]; and the IEEE Std 1696-2013, 'Standard for Terminology and Test Methods for Circuit Probes' [5]. In development is the IEEE Draft Std P2414 'Draft Standard for Jitter and Phase Noise.' The TC-10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, component manufacturers, the test instrumentation industry, academia, and end users. The status of the TC-10 standards is described herein.
The documentary standards of the IEEE technical committee 10
Rapuano S.;De Vito L.;
2020-01-01
Abstract
Global trade relies on the ability to reproducibly and accurately communicate the performance of products and to support these attestations. This standardization is essential for accurate, reproducible, reliable, and communicable characterization of the performance of these devices, to support technology and product advancement, product comparison and performance tracking, and device calibration and traceability. Standard terms and definitions, reproducible test methods, and accurate computational procedures are necessary for this communication and facilitate economic growth and technology evolution through the common understanding of technology. The IEEE Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement Society (IMS), fulfills the global need for standardized terms and test and computational methods for describing and/or measuring the parameters that describe the performance of signal generators and waveform recorders and analyzers. The TC-10 has developed and maintains the following documentary standards: IEEE Std 181-2011, 'Standard on Transitions, Pulses, and Related Waveforms' [1]; IEEE Std 1057-2017, 'Standard for Digitizing Waveform Recorders' [2]; IEEE Std 1241-2010, 'Standard for Terminology and Test Methods for Analog-to-Digital Converters' [3]; IEEE Std 1658-2011, 'Standard for Terminology and Test Methods for Digital-to-Analog Converters' [4]; and the IEEE Std 1696-2013, 'Standard for Terminology and Test Methods for Circuit Probes' [5]. In development is the IEEE Draft Std P2414 'Draft Standard for Jitter and Phase Noise.' The TC-10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, component manufacturers, the test instrumentation industry, academia, and end users. The status of the TC-10 standards is described herein.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
