Technical Debt (TD) concerns the lack of an adequate solution in a software project, from its design to the source code. Its admittance through comments or commit messages is referred to as Self-Admitted Technical Debt (SATD). Previous research has studied SATD from different perspectives, including its distribution, impact on software quality, and removal. In this paper, we investigate the relationship between refactorings and SATD removal. By leveraging a dataset of SATD and their removals in four open-source projects and by using an automated refactoring detection tool, we study the co-occurrence of refactorings and SATD removals. Results of the study indicate that refactorings are more likely to co-occur with SATD removals than with other commits, however, in most cases, they belong to different quality improvement activities performed at the same time.

Self-Admitted Technical Debt Removal and Refactoring Actions: Co-Occurrence or More?

Iammarino M.;Zampetti F.;Aversano L.;Di Penta M.
2019-01-01

Abstract

Technical Debt (TD) concerns the lack of an adequate solution in a software project, from its design to the source code. Its admittance through comments or commit messages is referred to as Self-Admitted Technical Debt (SATD). Previous research has studied SATD from different perspectives, including its distribution, impact on software quality, and removal. In this paper, we investigate the relationship between refactorings and SATD removal. By leveraging a dataset of SATD and their removals in four open-source projects and by using an automated refactoring detection tool, we study the co-occurrence of refactorings and SATD removals. Results of the study indicate that refactorings are more likely to co-occur with SATD removals than with other commits, however, in most cases, they belong to different quality improvement activities performed at the same time.
2019
978-1-7281-3094-1
Empirical Study; Refactoring; Self-Admitted Technical Debt
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12070/43622
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