Taking advantage of the electro-optical sampling technique we devised and tested a novel noninvasive appratus for the simultaneous measurement of the repetition frequency and the profile of sub-nanosecond rise time voltage pulses.

GAIN-SWITCHED LASER-DIODES FOR THE CHARACTERIZATION OF SUBNANOSECOND VOLTAGE PULSES

CUTOLO A;
1994

Abstract

Taking advantage of the electro-optical sampling technique we devised and tested a novel noninvasive appratus for the simultaneous measurement of the repetition frequency and the profile of sub-nanosecond rise time voltage pulses.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.12070/3974
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? 3
social impact