Taking advantage of the electro-optical sampling technique we devised and tested a novel noninvasive appratus for the simultaneous measurement of the repetition frequency and the profile of sub-nanosecond rise time voltage pulses.
GAIN-SWITCHED LASER-DIODES FOR THE CHARACTERIZATION OF SUBNANOSECOND VOLTAGE PULSES
CUTOLO A;
1994-01-01
Abstract
Taking advantage of the electro-optical sampling technique we devised and tested a novel noninvasive appratus for the simultaneous measurement of the repetition frequency and the profile of sub-nanosecond rise time voltage pulses.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
