The state of the art of the research on modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.
A state of the art on ADC modeling
Arpaia, P.;Daponte, P.;Rapuano, S.
2002-01-01
Abstract
The state of the art of the research on modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.File in questo prodotto:
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