We describe a new interferometric technique for the measurement of the recombination lifetime of electron-hole (eh) pairs as a function of their concentration, which can be measured with an error smaller than 10%. In addition, our approach is much more sensitive than the other optical methods described in the literature.
INTERFEROMETRIC MEASUREMENT OF ELECTRON-HOLE PAIR RECOMBINATION LIFETIME AS A FUNCTION OF THE INJECTION LEVEL
CUTOLO A;
1993-01-01
Abstract
We describe a new interferometric technique for the measurement of the recombination lifetime of electron-hole (eh) pairs as a function of their concentration, which can be measured with an error smaller than 10%. In addition, our approach is much more sensitive than the other optical methods described in the literature.File in questo prodotto:
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