In this paper an all-optical measurement procedure for the characterization of minority carrier recombination lifetime and surface recombination velocity is presented as a reliable tool to monitor the fabrication process of a standard crystalline silicon solar cell. In the methodology presented here, there are no stringent requirements concerning the state of wafer surface. The IMEC (Interuniversity Microelectronics Centre, Leuven, Belgium) fabrication process is taken as an example of the capability of this method to monitor the whole process from the silicon wafer to the finished cell. It is shown that the cell process does not degrade the bulk recombination lifetime and that the effect of the external surfaces is effectively screened. (C) 1999 Elsevier Science Ltd. All rights reserved.

Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell

Cutolo A;
1999-01-01

Abstract

In this paper an all-optical measurement procedure for the characterization of minority carrier recombination lifetime and surface recombination velocity is presented as a reliable tool to monitor the fabrication process of a standard crystalline silicon solar cell. In the methodology presented here, there are no stringent requirements concerning the state of wafer surface. The IMEC (Interuniversity Microelectronics Centre, Leuven, Belgium) fabrication process is taken as an example of the capability of this method to monitor the whole process from the silicon wafer to the finished cell. It is shown that the cell process does not degrade the bulk recombination lifetime and that the effect of the external surfaces is effectively screened. (C) 1999 Elsevier Science Ltd. All rights reserved.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12070/584
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? 7
social impact