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Titolo Data di pubblicazione Autore(i) File
Power Bipolar-Mode JFET (BMFET) versus BJT: a Comparative Analysis 1-gen-1991 Persiano, G; Strollo, A. G. M.; Spirito, P.
Trade-off between Blocking Voltage and Current Ratings in Normally-off Power BMFETs with Diffused Gates 1-gen-1991 Persiano, G; Strollo, A. G. M.; Spirito, P.
"Evaluation of Lateral Diffusion Factor in Silicon from Subthreshold Current in Short-Channel Vertical SIT Test Structure" 1-gen-1993 Spirito, P.; Persiano, Giovanni Vito; Strollo, A. G. M.
Effects of Epitaxial Doping on Current Characteristics in Power BMFETs 1-gen-1993 Persiano, G; Strollo, A. G. M.; Spirito, P.
"The Bipolar Mode FET: a new power device combining FET with BJT operation" 1-gen-1993 Spirito, P.; Persiano, G; Strollo, A. G. M.
"A Measurement Method of the Injection Dependence of Conductivity Mobility in Silicon ", 1-gen-1995 Bellone, S.; Persiano, G; Strollo, A. G. M.
"Analysis of Turn-on Transient in Power Bipolar-Mode FET (BMFET)" 1-gen-1995 Persiano, G; Spirito, P.; Strollo, A. G. M.
A New Method for the Measurement of the Conductivity Mobility as a Function of Injection Level in Silicon Regions 1-gen-1995 Bellone, S.; Persiano, G; Strollo, A. G. M.; Daliento, S.
The Influence of the Epitaxial Doping on the Turn-on Losses in Power Bipolar-Mode FET (BMFET) 1-gen-1995 Persiano, G; Strollo, A. G. M.; Spirito, P.
Small-Geometry Power BJT: Numerical Simulation and Experimental Results 1-gen-1995 Persiano, G; Strollo, A. G. M.; Spirito, P.; Patti, A.; Sapienza, S.
"Electrical Measurement of Electron and Hole Mobilities as a Function of Injection Level in Silicon" 1-gen-1996 Bellone, S.; Persiano, G; Strollo, A. G. M.
A New Test Structure for the Evaluation of the Injection-Level Dependence of Carrier Mobilities 1-gen-1996 Bellone, S.; Persiano, G.
"Test Structure Design for the Evaluation of Carrier-Carrier Scattering Effect on Hole and Electron Mobilities" 1-gen-1997 Persiano, G; Bellone, S.
"Activation of Parasitic Bipolar Transistor during Reverse Recovery of MOSFET's Intrinsic Diode" 1-gen-1997 Busatto, G.; Persiano, G; Strollo, A. G. M.; Spirito, P.
"A New Measurement Technique for the Conductivity Mobility vs. Injection Level in Silicon" 1-gen-1997 Bellone, S.; Persiano, G; Strollo, A. G. M.; Daliento, S.
Analysis of a New Test Pattern for Measuring the Carrier Mobilities versus Injection-Level Dependence in Silicon 1-gen-1998 Bellone, S.; Persiano, G; Parrella, C.
Test Structure Design for a Fast and Simple Evaluation of Carrier Mobilities in Highly Injected Regions 1-gen-1999 Persiano, G
"Experimental and Numerical Investigation on MOSFET’s Failure during Reverse Recovery of its Internal Diode" 1-gen-1999 Busatto, G.; Persiano, G; Iannuzzo, F.
Numerical Analysis of the Activation of the Parasitic BJT during the Reverse Recovery of Power MOSFET’s Internal Diode 1-gen-1999 Persiano, G; Iannuzzo, F. BUSATTO G.
"Measurement of the BJT Activation Current during the Reverse Recovery of Power MOSFET’s Drain-Source Diode" 1-gen-2001 Iannuzzo, F.; Persiano, G; Busatto, G.
Mostrati risultati da 1 a 20 di 44
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