Sfoglia per Autore
Power Bipolar-Mode JFET (BMFET) versus BJT: a Comparative Analysis
1991-01-01 Persiano, G; Strollo, A. G. M.; Spirito, P.
Trade-off between Blocking Voltage and Current Ratings in Normally-off Power BMFETs with Diffused Gates
1991-01-01 Persiano, G; Strollo, A. G. M.; Spirito, P.
"Evaluation of Lateral Diffusion Factor in Silicon from Subthreshold Current in Short-Channel Vertical SIT Test Structure"
1993-01-01 Spirito, P.; Persiano, Giovanni Vito; Strollo, A. G. M.
Effects of Epitaxial Doping on Current Characteristics in Power BMFETs
1993-01-01 Persiano, G; Strollo, A. G. M.; Spirito, P.
"The Bipolar Mode FET: a new power device combining FET with BJT operation"
1993-01-01 Spirito, P.; Persiano, G; Strollo, A. G. M.
"A Measurement Method of the Injection Dependence of Conductivity Mobility in Silicon ",
1995-01-01 Bellone, S.; Persiano, G; Strollo, A. G. M.
"Analysis of Turn-on Transient in Power Bipolar-Mode FET (BMFET)"
1995-01-01 Persiano, G; Spirito, P.; Strollo, A. G. M.
A New Method for the Measurement of the Conductivity Mobility as a Function of Injection Level in Silicon Regions
1995-01-01 Bellone, S.; Persiano, G; Strollo, A. G. M.; Daliento, S.
The Influence of the Epitaxial Doping on the Turn-on Losses in Power Bipolar-Mode FET (BMFET)
1995-01-01 Persiano, G; Strollo, A. G. M.; Spirito, P.
Small-Geometry Power BJT: Numerical Simulation and Experimental Results
1995-01-01 Persiano, G; Strollo, A. G. M.; Spirito, P.; Patti, A.; Sapienza, S.
"Electrical Measurement of Electron and Hole Mobilities as a Function of Injection Level in Silicon"
1996-01-01 Bellone, S.; Persiano, G; Strollo, A. G. M.
A New Test Structure for the Evaluation of the Injection-Level Dependence of Carrier Mobilities
1996-01-01 Bellone, S.; Persiano, G.
"Test Structure Design for the Evaluation of Carrier-Carrier Scattering Effect on Hole and Electron Mobilities"
1997-01-01 Persiano, G; Bellone, S.
"Activation of Parasitic Bipolar Transistor during Reverse Recovery of MOSFET's Intrinsic Diode"
1997-01-01 Busatto, G.; Persiano, G; Strollo, A. G. M.; Spirito, P.
"A New Measurement Technique for the Conductivity Mobility vs. Injection Level in Silicon"
1997-01-01 Bellone, S.; Persiano, G; Strollo, A. G. M.; Daliento, S.
Analysis of a New Test Pattern for Measuring the Carrier Mobilities versus Injection-Level Dependence in Silicon
1998-01-01 Bellone, S.; Persiano, G; Parrella, C.
Test Structure Design for a Fast and Simple Evaluation of Carrier Mobilities in Highly Injected Regions
1999-01-01 Persiano, G
"Experimental and Numerical Investigation on MOSFET’s Failure during Reverse Recovery of its Internal Diode"
1999-01-01 Busatto, G.; Persiano, G; Iannuzzo, F.
Numerical Analysis of the Activation of the Parasitic BJT during the Reverse Recovery of Power MOSFET’s Internal Diode
1999-01-01 Persiano, G; Iannuzzo, F. BUSATTO G.
"Measurement of the BJT Activation Current during the Reverse Recovery of Power MOSFET’s Drain-Source Diode"
2001-01-01 Iannuzzo, F.; Persiano, G; Busatto, G.
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile