Sfoglia per Rivista IEEE ELECTRON DEVICE LETTERS
Mostrati risultati da 1 a 3 di 3
"A Measurement Method of the Injection Dependence of Conductivity Mobility in Silicon ",
1995-01-01 Bellone, S.; Persiano, G; Strollo, A. G. M.
"Evaluation of Lateral Diffusion Factor in Silicon from Subthreshold Current in Short-Channel Vertical SIT Test Structure"
1993-01-01 Spirito, P.; Persiano, Giovanni Vito; Strollo, A. G. M.
INTERFEROMETRIC MEASUREMENT OF ELECTRON-HOLE PAIR RECOMBINATION LIFETIME AS A FUNCTION OF THE INJECTION LEVEL
1993-01-01 Breglio, G; Cutolo, A; Spirito, P; Zeni, L.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
"A Measurement Method of the Injection Dependence of Conductivity Mobility in Silicon ", | 1-gen-1995 | Bellone, S.; Persiano, G; Strollo, A. G. M. | |
"Evaluation of Lateral Diffusion Factor in Silicon from Subthreshold Current in Short-Channel Vertical SIT Test Structure" | 1-gen-1993 | Spirito, P.; Persiano, Giovanni Vito; Strollo, A. G. M. | |
INTERFEROMETRIC MEASUREMENT OF ELECTRON-HOLE PAIR RECOMBINATION LIFETIME AS A FUNCTION OF THE INJECTION LEVEL | 1-gen-1993 | Breglio, G; Cutolo, A; Spirito, P; Zeni, L. |
Mostrati risultati da 1 a 3 di 3
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